The IC Test-Clip for fast, safe access to Plastic Leaded Chip Carrier (PLCC) style integrated circuits
This Surface Mount Test Clip is state Of the art for testing Plastic Leaded Chip Carrier (PLCC) style integrated circuits. The test clip has a unique action wedge design with all four sides opening simultaneously providing a faster and easier attachment to the PLCC.
The compression spring and insulating contact combs ensure contact integrity when testing an IC. Our narrow body design allows components to be tested with as little as 2.54 mm (0.1") lead-to-lead spacing, side. Stackable at 0.200" lead-to-lead spacing.
Probe access points are immediately visible for fast and safe individual lead testing, while staggered contact rows on 0.100" centres allow for easy probe attachment and help prevent accidental shorting of adjacent probes, Industry standard 0.025" square contact pins permit easy attachment of female socket connectors or hook/ grabber style test connections.
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