923650-28 28pin Narrow SOIC Test Clip - Alloy

AP Products 923650-28 28pin 0.15" Narrow SOIC Test Clip - Alloy

The SOIC Test Clips look similar to their "sibling", our standard DIL Test Clip but are specially designed for Small Outline Integrated Circuits (SO-ICs). 
 
The distance between pins at the front of the Test Clip is only 1.27 mm (0.050'') to enable them to make contact with an ICs pins.  But the distance between pins at the connector interface where you would make a connection with a lead or test grabber is 2.54 mm . This pitch enables an easy attachment of the test point and ensures that unnecessary short circuits are avoided.

The connector interface pins are standard 0,64 mm square pins enable an easy attachment of a header, socket or test hook/grabber.

Like all of our Test-Clips, it has an extra strong pressure spring, which ensures a good contact. With our SOIC Test-Clips even IC's having a spacing of only 0.64 mm can be tested.

X dimension = (0.720") 18.29mm